NDT & Metrology

Inspect, Measure and Analyze a Transistor Using Industrial Computed Tomography 3D X ray

Inspection of a transistor can easily be performed using industrial computed tomography scanning (an x-ray technology) to examine internal and external features. Industrial CT scanning allows for internal and external analysis of the transistor, by virtually slicing through the transistor on the 3D computer rendering. Measurement can also be taken to analyze a defect or failure of the solder joints and connections.  Jesse Garant & Associates is a metrology laboratory offering services for industrial CT scanning (3D x-ray), a NDT method. For more information on the CT inspection techniques for transistors and various other electronic components, visit www.jgarantmc.com


The Next Step

Learn more about JG&A Metrology Center’s Industrial CT Scanning inspection services for industrial applications.