NDT & Metrology

Inspect, Measure and Analyze a Semiconductor Using Industrial Computed Tomography 3D X ray

Inspection of a semiconductor can easily be performed using industrial computed tomography scanning (an x-ray technique) to examine internal and external features. CT scanning allows for analysis of the semiconductor both outside and inside, by virtually slicing through the semiconductor on the 3D computer rendering. Measurement can also be taken to analyze a defect or failure of the solder joints and connections.  Jesse Garant & Associates is a metrology laboratory offering services for industrial ct scanning (3D xray) a NDT. For more information on the CT inspection techniques for semiconductors and various other electronic components, visit www.jgarantmc.com


Learn More About Our Part Inspection Services

3D Internal

CT Scanning

Internal inspection and validation in 3D without destroying your part.


2D Internal

Industrial X-Ray

Quick 2D internal part inspection in an easy to interpret digital format.


3D External

3D Scanning

High accuracy and high resolution 3D external part inspection services.