NDT & Metrology

Inspect, Measure and Analyze a Semiconductor Using Industrial Computed Tomography 3D X ray

Inspection of a semiconductor can easily be performed using industrial computed tomography scanning (an x-ray technique) to examine internal and external features. CT scanning allows for analysis of the semiconductor both outside and inside, by virtually slicing through the semiconductor on the 3D computer rendering. Measurement can also be taken to analyze a defect or failure of the solder joints and connections.  Jesse Garant & Associates is a metrology laboratory offering services for industrial ct scanning (3D xray) a NDT. For more information on the CT inspection techniques for semiconductors and various other electronic components, visit www.jgarantmc.com


The Next Step

Learn more about JG&A Metrology Center’s Industrial CT Scanning inspection services for industrial applications.